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Article
Sudarsanan, Akhil and Nayak, Kaushik (2021) Immunity to random fluctuations induced by interface trap variability in Si gate-all-around n-nanowire field-effect transistor devices. Journal of Computational Electronics, 20 (3). pp. 1169-1177. ISSN 1569-8025
Sudarsanan, Akhil and Nayak, Kaushik (2021) TCAD-Based Investigation of Statistical Variability Immunity in U-Channel FDSOI n-MOSFET for Sub-7-nm Technology. IEEE Transactions on Electron Devices, 68 (6). pp. 2611-2617. ISSN 0018-9383
