Device Electrostatics and High Temperature Operation of Oxygen Terminated Boron Doped Diamond MOS Capacitor and MOSFET

Pullaiah, Y and Emani, Naresh Kumar and Nayak, Kaushik (2020) Device Electrostatics and High Temperature Operation of Oxygen Terminated Boron Doped Diamond MOS Capacitor and MOSFET. In: 4th IEEE Electron Devices Technology and Manufacturing (EDTM) Conference, 16 – 18 March 2020, Penang, Malaysia.

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IITH Creators:	IITH Creators ORCiD Emani, Naresh Kumar https://orcid.org/0000-0002-0488-921X Nayak, Kaushik UNSPECIFIED
Item Type:	Conference or Workshop Item (Paper)
Subjects:	Electrical Engineering
Divisions:	Department of Electrical Engineering
Depositing User:	Team Library
Date Deposited:	24 Dec 2019 09:42
Last Modified:	24 Dec 2019 09:42
URI:	http://raiithold.iith.ac.in/id/eprint/7248
Publisher URL:
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