Impact of Phonon Boundary Scattering on Self-heating Effects in Stacked Si Nano-sheet FET in sub-7nm Logic Technologies

Venkateswarlu, Sankatali and Sudarsanan, Akhil and Nayak, Kaushik (2019) Impact of Phonon Boundary Scattering on Self-heating Effects in Stacked Si Nano-sheet FET in sub-7nm Logic Technologies. In: XXth International Workshop on the Physics of Semiconductor Devices (IWPSD), 17-20 December 2019, Kolkata, India. (Submitted)

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IITH Creators:	IITH Creators ORCiD Nayak, Kaushik UNSPECIFIED
Item Type:	Conference or Workshop Item (Paper)
Subjects:	Electrical Engineering
Divisions:	Department of Electrical Engineering
Depositing User:	Team Library
Date Deposited:	24 Dec 2019 09:30
Last Modified:	24 Dec 2019 09:30
URI:	http://raiithold.iith.ac.in/id/eprint/7247
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