Single Electron Precision in the Measurement of Charge Distributions on Electrically Biased Graphene Nanotips Using Electron Holography

Vicarelli, Leonardo and Migunov, Vadim and Malladi, Sairam K. and et al, . (2019) Single Electron Precision in the Measurement of Charge Distributions on Electrically Biased Graphene Nanotips Using Electron Holography. Nano Letters, 19 (6). pp. 4091-4096. ISSN 1530-6984

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Abstract

We use off-axis electron holography to measure the electrostatic charge density distributions on graphene-based nanogap devices that have thicknesses of between 1 and 10 monolayers and separations of between 8 and 58 nm with a precision of better than a single unit charge. Our experimental measurements, which are compared with finite element simulations, show that wider graphene tips, which have thicknesses of a single monolayer at their ends, exhibit charge accumulation along their edges. The results are relevant for both fundamental research on graphene electrostatics and applications of graphene nanogaps to single nucleotide detection in DNA sequencing, single molecule electronics, plasmonic antennae, and cold field emission sources.

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IITH Creators:
IITH CreatorsORCiD
Malladi, Sairam KUNSPECIFIED
Item Type: Article
Uncontrolled Keywords: Graphene, in situ transmission electron microscopy, nanogap, off-axis electron holography,Indexed in Scopus and WoS
Subjects: Materials Engineering > Materials engineering
Divisions: Department of Material Science Engineering
Depositing User: Library Staff
Date Deposited: 14 Oct 2019 04:29
Last Modified: 14 Oct 2019 04:29
URI: http://raiithold.iith.ac.in/id/eprint/6565
Publisher URL: http://doi.org/10.1021/acs.nanolett.9b01487
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