Micro-shear deformation of pure copper

Pfetzing-Micklich, J and Brinckmann, S and Dey, Suhash Ranjan and Otto, F and Hartmaier, A and Eggeler, G (2011) Micro-shear deformation of pure copper. Materials Science and Engineering Technology / Materialwissenschaft und Werkstofftechnik, 42 (3). pp. 219-223. ISSN 0933-5137

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Abstract

In this paper a new micro-shear experiment is introduced using a double shear specimen machined by a focused ion beam technique. The micro-shear specimen is structured from pure copper promoting (111) [101] slip. Comparing scanning electron microscopy images before and after deformation provides evidence for localized shear. Load-displacement data identify a load plateau and characterize the localized shear process (critical shear-stress for activation of (111) [101] slip: 170 MPa).

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IITH Creators:	IITH Creators ORCiD Dey, Suhash Ranjan http://orcid.org/0000-0002-5148-9534
Item Type:	Article
Uncontrolled Keywords:	fokussierte Ionenstrahlung; Gleitsystem; Kupfer; Nanoindentation; Scherverformung
Subjects:	Others > Metallurgy
Divisions:	Department of Material Science Engineering
Depositing User:	Team Library
Date Deposited:	07 Nov 2014 06:26
Last Modified:	07 Sep 2017 08:59
URI:	http://raiithold.iith.ac.in/id/eprint/641
Publisher URL:	https://doi.org/10.1002/mawe.201100715
OA policy:	http://www.sherpa.ac.uk/romeo/issn/0933-5137/
Related URLs:	Google Scholar

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