Kashfuddoja, M and M, Ramji
(2015)
Whole field strain measurement in critical thin adhesive layer of single and double sided repaired CFRP panel using DIC.
In: International Conference on Experimental Mechanics, 15-17, Nov 2014, Singapore,.
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Abstract
In the present work, the behavior of thin adhesively layer in patch repaired carbon fiber reinforced polymer (CFRP) panel under tensile load is investigated experimentally using digital image correlation (DIC) technique. The panel is made of Carbon/epoxy composite laminate and the stacking sequence in the panel is NT. A circular hole of 10 mm diameter (d) is drilled at the center of the panel to mimic the case of low velocity impact damage removal. The panel with open hole is repaired with double sided (symmetrical) and single sided (unsymmetrical) rectangular patch made of same panel material having stacking sequence of pl. Araldite 2011 is used for bonding the patch onto the panel over the damaged area. The global behavior of thin adhesive layer is examined by analyzing whole field strain distribution using DIC. Longitudinal, peel and shear strain field in both double and single sided repair configuration is studied and a compression is made between them. An estimate of shear transfer length which is an essential parameter in arriving at an appropriate overlap length in patch design is proposed from DIC and FEA. Damage development, failure mechanism and load displacement behavior is also investigated. The experimental results are compared with the numerical predictions.
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IITH Creators: |
IITH Creators | ORCiD |
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M, Ramji | UNSPECIFIED |
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Item Type: |
Conference or Workshop Item
(Paper)
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Uncontrolled Keywords: |
Adhesive Strain; Bonded composite repair; Carbon/Epoxy composite; Digital image correlation; Debonding; Load transfer/shear transfer length; Longitudinal; Peel and Shear strain; Finite element analysis |
Subjects: |
?? sub4.9 ?? |
Divisions: |
Department of Physics |
Depositing User: |
Team Library
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Date Deposited: |
16 May 2016 09:45 |
Last Modified: |
17 May 2016 10:18 |
URI: |
http://raiithold.iith.ac.in/id/eprint/2361 |
Publisher URL: |
http://dx.doi.org/10.1117/12.2079142 |
Related URLs: |
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