Evaluation of deep Gaussian processes for text classification

Jayashree, P. and Srijith, P K (2020) Evaluation of deep Gaussian processes for text classification. In: 12th International Conference on Language Resources and Evaluation, LREC 2020, 11 May 2020through 16 May 2020, Marseille.

Full text not available from this repository. (Request a copy)

Abstract

With the tremendous success of deep learning models on computer vision tasks, there are various emerging works on the Natural Language Processing (NLP) task of Text Classification using parametric models. However, it constrains the expressability limit of the function and demands enormous empirical efforts to come up with a robust model architecture. Also, the huge parameters involved in the model causes over-fitting when dealing with small datasets. Deep Gaussian Processes (DGP) offer a Bayesian non-parametric modelling framework with strong function compositionality, and helps in overcoming these limitations. In this paper, we propose DGP models for the task of Text Classification and an empirical comparison of the performance of shallow and Deep Gaussian Process models is made. Extensive experimentation is performed on the benchmark Text Classification datasets such as TREC (Text REtrieval Conference), SST (Stanford Sentiment Treebank), MR (Movie Reviews), R8 (Reuters-8), which demonstrate the effectiveness of DGP models. © European Language Resources Association (ELRA), licensed under CC-BY-NC

[error in script]
IITH Creators:
IITH CreatorsORCiD
Srijith, P Khttps://orcid.org/0000-0002-2820-0835
Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: Bayesian deep learning, Convolutional Gaussian Process, Gaussian Process, Text Classification
Subjects: Computer science
Divisions: Department of Computer Science & Engineering
Depositing User: . LibTrainee 2021
Date Deposited: 03 Nov 2022 13:23
Last Modified: 03 Nov 2022 13:23
URI: http://raiithold.iith.ac.in/id/eprint/11144
Publisher URL:
Related URLs:

Actions (login required)

View Item View Item
Statistics for RAIITH ePrint 11144 Statistics for this ePrint Item